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Part Number: SMJ27C512-25JM

Alternate P/N: SMJ27C51225JM

Manufacturer: Austin Semiconductor Inc

NSN: 5962-01-333-3430

NIIN: 013333430

Item Name : Microcircuit Memory

CAGE Code: 0EU86

FSC: 5962 Microcircuits Electronic

FSG: 59 Electrical and Electronic Equipment Components

Country: USA

NCB Code: 01

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At Broadline NSN, we are dedicated to distributing reliable products such as those with the NSN 5962-01-333-3430 or CAGE code 0EU86. As an AS9120B, ISO 9001:2015, and FAA AC 00-56B accredited parts distributor, you can rely on the caliber of our offerings which feature more than 2 billion new, used, obsolete, and hard-to-find components that are readily available for your purchase at any time. Countless products are subject to rigorous quality control measures to guarantee their fit, form, and function prior to your purchase for your benefit, and all come from leading manufactures like Austin Semiconductor Inc. Those looking for high-quality parts like listings belonging to the FSC 5962 Microcircuits Electronic can count on our team to get them what they need in rapid time. Call or email us with any questions and we will be more than happy to assist you through any stage of the procurement process.

NSN Information for Part Number SMJ27C512-25JM with NSN 5962-01-333-3430, 5962013333430

NSN	FSC	NIIN	CLS	Hazmat	DEMIL	Cancelled NSN
5962-01-333-3430 Item PartTypeName: MICROCIRCUIT,MEMORY	5962	013333430	0	N	D
	CIIC	HCC	ESD	PMIC	Criticality	ENAC
	7		D	A	0
Part Number	ISC	RNVC	RNCC	HCC	MSDS	SADC
5962-8764801XB	5	9	5

Characteristics Data of NSN 5962-01-333-3430, 5962013333430

MRC	Criteria	Characteristic
ADAT	BODY WIDTH	0.500 INCHES MINIMUM AND 0.610 INCHES MAXIMUM
CBBL	FEATURES PROVIDED	HERMETICALLY SEALED AND BURN IN AND PROGRAMMABLE AND ULTRAVIOLET ERASABLE
CQSJ	INCLOSURE MATERIAL	CERAMIC
TTQY	TERMINAL TYPE AND QUANTITY	28 PRINTED CIRCUIT
ADAQ	BODY LENGTH	1.490 INCHES MAXIMUM
CWSG	TERMINAL SURFACE TREATMENT	SOLDER
AFGA	OPERATING TEMP RANGE	-55.0 TO 125.0 DEG CELSIUS
AFJQ	STORAGE TEMP RANGE	-65.0 TO 150.0 DEG CELSIUS
CQSZ	INCLOSURE CONFIGURATION	DUAL-IN-LINE
CQWX	OUTPUT LOGIC FORM	COMPLEMENTARY-METAL OXIDE-SEMICONDUCTOR LOGIC
CZZZ	MEMORY CAPACITY	UNKNOWN
TEST	TEST DATA DOCUMENT	96906-MIL-STD-883 STANDARD (INCLUDES INDUSTRY OR ASSOCIATION STANDARDS,INDIVIDUAL MANUFACTUREER STANDARDS,ETC.).
ABKW	OVERALL HEIGHT	0.357 INCHES MINIMUM AND 0.432 INCHES MAXIMUM
ADAU	BODY HEIGHT	0.172 INCHES MINIMUM AND 0.217 INCHES MAXIMUM
AEHX	MAXIMUM POWER DISSIPATION RATING	350.0 MILLIWATTS
CQZP	INPUT CIRCUIT PATTERN	26 INPUT
CTFT	CASE OUTLINE SOURCE AND DESIGNATOR	D-10 MIL-M-38510
CTQX	CURRENT RATING PER CHARACTERISTIC	60.00 MILLIAMPERES MAXIMUM SUPPLY
CZEN	VOLTAGE RATING AND TYPE PER CHARACTERISTIC	5.0 VOLTS NOMINAL POWER SOURCE
CZEQ	TIME RATING PER CHACTERISTIC	150.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME,LOW TO HIGH LEVEL OUTPUT AND 150.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME,HIGH TO LOW LEVEL OUTPUT
CZER	MEMORY DEVICE TYPE	EPROM